Federated self-supervised learning (FSSL) has recently emerged as a promising paradigm that enables the exploitation of clients' vast amounts of unlabeled data while preserving data privacy. While FSSL offers advantages, its susceptibility to backdoor attacks, a concern identified in traditional federated supervised learning (FSL), has not been investigated. To fill the research gap, we undertake a comprehensive investigation into a backdoor attack paradigm, where unscrupulous clients conspire to manipulate the global model, revealing the vulnerability of FSSL to such attacks. In FSL, backdoor attacks typically build a direct association between the backdoor trigger and the target label. In contrast, in FSSL, backdoor attacks aim to alter the global model's representation for images containing the attacker's specified trigger pattern in favor of the attacker's intended target class, which is less straightforward. In this sense, we demonstrate that existing defenses are insufficient to mitigate the investigated backdoor attacks in FSSL, thus finding an effective defense mechanism is urgent. To tackle this issue, we dive into the fundamental mechanism of backdoor attacks on FSSL, proposing the Embedding Inspector (EmInspector) that detects malicious clients by inspecting the embedding space of local models. In particular, EmInspector assesses the similarity of embeddings from different local models using a small set of inspection images (e.g., ten images of CIFAR100) without specific requirements on sample distribution or labels. We discover that embeddings from backdoored models tend to cluster together in the embedding space for a given inspection image. Evaluation results show that EmInspector can effectively mitigate backdoor attacks on FSSL across various adversary settings. Our code is avaliable at https://github.com/ShuchiWu/EmInspector.

With the rapid growth of display devices, quality inspection via machine vision technology has become increasingly important for flat-panel displays (FPD) industry. This paper discloses a novel visual inspection system for liquid crystal display (LCD), which is currently a dominant type in the FPD industry. The system is based on two cornerstones: robust/high-performance defect recognition model and cognitive visual inspection service architecture. A hybrid application of conventional computer vision technique and the latest deep convolutional neural network (DCNN) leads to an integrated defect detection, classfication and impact evaluation model that can be economically trained with only image-level class annotations to achieve a high inspection accuracy. In addition, the properly trained model is robust to the variation of the image qulity, significantly alleviating the dependency between the model prediction performance and the image aquisition environment. This in turn justifies the decoupling of the defect recognition functions from the front-end device to the back-end serivce, motivating the design and realization of the cognitive visual inspection service architecture. Empirical case study is performed on a large-scale real-world LCD dataset from a manufacturing line with different layers and products, which shows the promising utility of our system, which has been deployed in a real-world LCD manufacturing line from a major player in the world.